研究成果藝廊 > 奈米級二次離子質譜儀計畫(NanoSIMS)

研究成果藝廊

奈米級二次離子質譜儀計畫(NanoSIMS)

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Secondary Ion Imaging by NanoSIMS

圖片來源: Kota Naito and the NanoSIMS Team

A schematic diagram of secondary ion imaging by NanoSIMS.

Owing to the seven detectors in the multi-collection chamber, the NanoSIMS 50L is capable of analysing the sample surface in up to seven ion species, simultaneously. Since the primary beam can be rastered -i.e. the beam can be translated both horizontally and vertically, it can perform secondary ion imaging via pixel-to-pixel collections of ions, ejected from the sample surface. As a result, one can visually examine a few distinct isotopic signatures of the sample all at once.