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奈米級二次離子質譜儀計畫(NanoSIMS)

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Micrometer-scale ion images of the cross-section of SaU 290 (CH3 chondrite), recorded by the NanoSIMS 50L at Academia Sinica. A ~10 pA Cs+ primary beam with a nominal spot size of 100 nm and rastered over 20 × 20 µm, to image the sample surface simultaneously in several ion species. A total of 160 (10 × 16 rows) individual images were recorded, and these were combined to create maps in a) 16O- and b) 18O-, as well as c) secondary electrons.
Micrometer-scale ion images of the cross-section of SaU 290
Micrometer-scale ion images of the cross-section of SaU 290 (CH3 chondrite), recorded by the NanoSIMS 50L at Academia Sinica. A ~10 pA Cs+ primary beam with a nominal spot size of 100 nm and rastered over 20 × 20 µm, to image the sample surface simultaneously in several ion species. A total of 160 (10 × 16 rows) individual images were recorded, and these were combined to create maps in a) 16O- and b) 18O-, as well as c) secondary electrons.
Micrometer-scale ion images of the cross-section of SaU 290
Micrometer-scale ion images of the cross-section of SaU 290 (CH3 chondrite), recorded by the NanoSIMS 50L at Academia Sinica. A ~10 pA Cs+ primary beam with a nominal spot size of 100 nm and rastered over 20 × 20 µm, to image the sample surface simultaneously in several ion species. A total of 160 (10 × 16 rows) individual images were recorded, and these were combined to create maps in a) 16O- and b) 18O-, as well as c) secondary electrons.
Micrometer-scale ion images of the cross-section of SaU 290
Micrometer-scale ion images of the cross-section of SaU 290 (CH3 chondrite), recorded by the NanoSIMS 50L at Academia Sinica. A ~10 pA Cs+ primary beam with a nominal spot size of 100 nm and rastered over 20 × 20 µm, to image the sample surface simultaneously in several ion species. A total of 160 (10 × 16 rows) individual images were recorded, and these were combined to create maps in a) 16O- and b) 18O-, as well as c) secondary electrons.
Micrometer-scale ion images of the cross-section of SaU 290
The cross-section of Sayh al Uhaymir (SaU) 290, a CH3 chondrite, observed by the NanoSIMS in a) secondary electrons, b) <sup>16</sup>O<sup>−</sup>, c) <sup>12</sup>C<sub>2</sub><sup>−</sup> and d) <sup>12</sup>C<sup>14</sup>N<sup>−</sup>. Each square grid represents a single NanoSIMS image, capturing a surface area of 20 × 20 μm<sup>2</sup>. By recording and stitching a large number of these single images, the maps (a) - (d) were created to analyse the microscale surface morphology and chemical distribution of SaU 290.
Cross-Section of Carbonaceous Chondrite Observed in Various Ion Species
A schematic diagram of secondary ion imaging by NanoSIMS.
Secondary Ion Imaging by NanoSIMS
The control console in the center of this picture. The instrument is located next door. This is to ensure the maximum stability of NanoSIMS.
NanoSIMS control room
NanoSIMS sits on an anti-vibration platform
NanoSIMS instrument room

奈米級二次離子質譜儀實驗室由中研院天文及天文物理研究所與地球科學研究所共同創立。主要研究重心為早期太陽系，使用CAMECA公司的NanoSIMS 50L儀器分析地球及太空樣本。 本實驗室位於中央研究院跨領域科技研究大樓，於2013年11月引進全球第33台奈米級二次離子質譜儀(NanoSIMS)，成為台灣唯一的NanoSIMS實驗室。本實驗室和國內外研究團隊合作，進行諸多跨學科研究計畫。目前的研究範圍包含核天體物理學、天體生物學、地球化學、海洋生物化學以及植物生物學。

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