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成果發表 > 研究成果藝廊 > 奈米級二次離子質譜儀計畫
研究成果藝廊
奈米級二次離子質譜儀計畫
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Micrometer-scale ion images of the cross-section of SaU 290 Micrometer-scale ion images of the cross-section of SaU 290 (CH3 chondrite), recorded by the NanoSIMS 50L at Academia Sinica. A ~10 pA Cs+ primary beam with a nominal spot size ...(more) |
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Cross-Section of Carbonaceous Chondrite Observed in Various Ion Species The cross-section of Sayh al Uhaymir (SaU) 290, a CH3 chondrite, observed by the NanoSIMS in a) secondary electrons, b) 16O−, c) 12C2− and d) 12C14N−. Each square grid represents ...(more) |
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Secondary Ion Imaging by NanoSIMS A schematic diagram of secondary ion imaging by NanoSIMS. ...(more) |
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NanoSIMS control room The control console in the center of this picture. The instrument is located next door. This is to ensure the maximum stability of NanoSIMS. ...(more) |
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NanoSIMS instrument room NanoSIMS sits on an anti-vibration platform ...(more) |
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